A.V.Koval'chuk
The low-frequency dielectric spectroscopy (LFDS) is shown
to be an effective method to study double electric layers (DEL) on
an electrode-weak electrolyte interface. This method is based on the
fact of the electric field redictribution within the sample as the
frequency is lowered as well as on different relaxation times corresponding
to various mechanisms of the DEL formation. Using studies of various
systems as examples, DEL parameters obtained by means of the LFDS
methos are shown to depend mainly on the sample resistivity. It follows
from data obtained that any theory considering
motion of ions
as that of non-interacting particles cannot explain why a rather long
time (tens, hundreds or even thousands of seconds) is required
for the dielectric relaxation in a relatively thin (several nm)
near-electrode region.