X-ray fluorescent analysis of multi-component system compositions

M.V.Reshetnyak, I.F.Mikhaylov

Kharkiv State Polytechnical University, 21 Frunze St., 61002 Kharkiv, Ukraine

Received August 4, 1999

The solution of X-ray fluorescence spectrum quantitative and qualitative analysis task has been proposed in the framework of the united mathematical approach of spectrum full-profile treatment. Experimental shapes of pure-element etalon profiles approximated by splines have been chosen as a basis for the spectrum decomposition. It has been shown that the detection limit of superimposed lines is defined by the accuracy of the profile shape approximation and can be reduced by difference treatment.

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