Pb(ZrxTi1-x)O3 ferroelectric
films deposited
on LaAlO3 substrates and measurements
of their dielectric constant
I.N.Chukanova, Yu.G.Makeev*, A.P.Motornenko*,
Zh.I.Klitsova, T.S.Teplitskaya
Institute for Single Crystals, National Academy of Sciences
of Ukraine,
60 Lenin Ave., 61001 Kharkiv, Ukraine
*O.Usikov Institute of Radiophysics and Electronics, National Academy
of Sciences of Ukraine, 12 Proskury St., 61085 Kharkiv, Ukraine
Received March 6, 1999
A noncontact technique has been proposed to measure dielectric
parameters of Pb(ZrxTi1-x)O3 films
obtained on LaAlO3 substrates using pulse laser deposition.
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