Pb(ZrxTi1-x)O3 ferroelectric films deposited on LaAlO3 substrates and measurements of their dielectric constant

I.N.Chukanova, Yu.G.Makeev*, A.P.Motornenko*, Zh.I.Klitsova, T.S.Teplitskaya

Institute for Single Crystals, National Academy of Sciences of Ukraine, 60 Lenin Ave., 61001 Kharkiv, Ukraine *O.Usikov Institute of Radiophysics and Electronics, National Academy of Sciences of Ukraine, 12 Proskury St., 61085 Kharkiv, Ukraine

Received March 6, 1999

A noncontact technique has been proposed to measure dielectric parameters of Pb(ZrxTi1-x)O3 films obtained on LaAlO3 substrates using pulse laser deposition.

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