Funct. Mater. 2015; 20 (3): 402-406.

http://dx.doi.org/10.15407/fm20.03.402

New materials for luminescent scanning near-field microscopy 

V.Chornii[1], O. Chukova[1], Yu. Hizhnyi[1], S.G. Nedilko[1], S.A. Nedilko[1], K. Terebilenko[1], M. Slobodyanik[1], L. Aigouy[2], L. Billot[2], V. Boyko[3], S. Virko[4], O. Gomenyuk[5]

[1]T. Shevchenko National University of Kyiv, 64/13 Volodymyrska St., Kyiv, 01601, Ukraine

[2] Laboratoire de Physique et d'Etude des Materiaux, ESPCI-CNRS UMR 8213, 10 rue Vauquelin, Paris, 75231, France

[3] National University of Life and Environmental Science of  Ukraine, 15 Geroiv Oborony St., Kyiv, 03041, Ukraine

[4] V.Lashkaryov Institute for Semiconductor Physics, National Academy of Sciences of Ukraine, of Ukraine, 41, pr. Nauki, Kyiv, 03028, Ukraine

[5] Glukhiv National Pedagogical University, 24 Kyjevo-Moskovs'ka St., Glukhiv, 41400, Ukraine

Abstract: 

Results on synthesis and characterization of the luminescent probes for applications in determination of near-field optical characteristics and spatial distribution of local temperature are presented. Two types of materials are studied: Eu3+ doped vanadates LaVO4, and chromium-doped composites (NaAl(MoO4)2/Al2O3):Cr. It was shown that submicron-sized particles of the mentioned materials can be used for development of the luminescent probes for near-field optical applications.

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