Funct. Mater. 2014; 21 (3): 297-301.

Annealing temperature modes influence on properties of heterophase nanocomposites based on ceramics "glass - Ag-Pd" systems

Ya.I.Lepikh, T.I.Lavrenova, T.N.Bugayova, N.P.Zatovskaya, P.O.Snigur

Odesa I.Mechnikov National University, Interdepartmental Scientific-educational Physicotechnical Centre of MES and NAS of Ukraine, 2 Dvoryanskaya Str., 65082 Odesa, Ukraine


Temperature formation modes influence on the electric parameters and operational characteristics thick-film elements made of nanocomposite system "glass - Ag-Pd" are investigated. The manufacturing techniques are described, thick-film elements optimum modes manufacturing are determined. The developed optical attachment for thick-film element IR spectroscopy is described. The nanocomposites based on systems "glass - Ag-Pd" phase structure changing at various formation temperatures was investigated by IR-spectroscopy of reiterated total reflection method. Qualitative and quantitative chemical analyses of conducting thick-film layers are carried out. Film spectra and structure are analyzed.


1. V.G.Grebenkina, V.S.Dobroer, L.I.Panov, U.P.Trizna, Thick-film Microelectronics, Naukova Dumka, Kiev (1983) [in Russian].

2. N.S.Puchkova, A.N.Smirnov, A.I.Lazur, Techn. and Design. Electron. Equip., No.5-6, 58 (2000).

3. L.I.Panov, R.G.Sidorets, Techn. and Design. Electron. Equip., No.1, 43 (2002).

4. Ya.I.Lepih, T.I.Lavrenova, T.N.Bugayova, Bull. Kiev Nation. Univer. Techn. and Design, No.3, 126 (2013).

5. Sh.D.Kurmashev, T.I.Lavrenova, T.N.Bugayova, in: Proc. Intern. Scien. Conf. "Nanostructure Materials - 2010", Kiev (2010), p.329.

6. V.M.Proleyko, V.A.Abramov, V.N.Bryunin, Quality Management Systems of Microelectronics Devices, Sov. Radio, Moscow (1976) [in Russian].

7. N.I.Dokuchaev, I.Ya.Kozyr', D.I.Ononko, Testings and Measurements IBS, Izd-vo MIET, Moscow (1997) [in Russian].

8. L.Mattera, Electronics, No.20, 43 (1975).

9. A.V.Stolbikov, Yu.P.Erendeev, in: Proc. Intern. Symposium "Reliability and Quality", (2006), v.2, p.23.

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