Funct. Mater. 2015; 22 (3): 402-407.

XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality

V.M.Puzikov , V.F.Tkachenko, V.A.Tsurikov

Institute for Single Crystals, STC ”Institute for Single Crystals”, National Academy of Sciences of Ukraine, 60 Lenin Ave., 61001 Kharkiv, Ukraine


Designed precision method for determining residual stresses in crystals of the KDP on the relative displacement of the rocking curves (RC), caused by the presence of tensile stress, compression from the {110} or {101}, with the asymmetric geometry of the shooting at the reflection. The error in determining the relative displacement of RC in this case is ±1 arcsec. The experimentally determined bias for RD crystals KDP, grown by different methods on samples cut from the prismatic and pyramidal growth sectors of the crystal. The relation between the value of the anomalous biaxiality 2V and a total displacement of RC due to the presence of internal tensile stress, compression in the crystal KDP.

KDP crystals, shooting reflection, residual stresses.

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