Funct. Mater. 2016; 23 (1): 005-014.
Perspectives of development of X-ray analysis for material composition
National Technical University "Kharkiv Polytechnical Institute", 21 Frunze Str., 61002 Kharkiv, Ukraine
Perspectives are considered for increasing the sensitivity of X-ray analysis and broadening the range of measurements toward chemical elements with small atomic numbers up to hydrogen at the expense of formation of the optimized selective spectrum from a preliminary beam for exciting fluorescence and observing scattering peaks and diffraction reflections. It has been shown that low-power preliminary sources (X-ray tube, 20 W) are able to provide the detection limit for trace impurities near 0.1 ppm, and for hydrogen in metals - up to 10 ppm. The data presented are hopeful for attaining X-ray analysis sensitivity at the level of ppb units due to application of powerful preliminary beams (synchrotron, undulators, wigglers, etc.).
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