Funct. Mater. 2016; 23 (1): 032-039.

Structural and microstructural properties of Cd1-xZnxTe films deposited by close spaced vacuum sublimation

Y.V.Znamenshchykov1, V.V.Kosyak1, A.S.Opanasyuk1, M.M.Kolesnyk1, V.V.Grinenko1, P.M.Fochuk2

1Sumy State University, 2 Rymskogo-Korsakova Str., 40007 Sumy, Ukraine
2Y.Fedkovych Chernivtsi National University, 2 Kotsjubynskyi Str., 58012 Chernivtsi, Ukraine


The structural properties (microstresses, texture, lattice parameter, coherent scattering domains size) and chemical composition of Cd1-xZnxTe (CZT) films with variable zinc concentration were studied. Films were deposited on molybdenum coated glass substrates by close spaced vacuum sublimation method. Properties of samples were investigated by X-ray diffraction, energy dispersive spectroscopy, scanning electron microscopy. Zinc concentration in CdZnTe layers was determined by the EDS and from the lattice parameter, according to the literature data. Namely, it was determined that the CZT films had following Zn concentrations: x = 0.09, x = 0.24, x = 0.30.

composition of Cd<sub>1-x</sub>Zn<sub>x</sub>Te, microstresses, texture, lattice parameter, coherent scattering domains size.

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