Funct. Mater. 2022; 29 (3): 419-428.
Formation of a through conductive inclusion in a layered sample with sector conductive inclusions in single layers. Probability of a through inclusion appearance
1Institute for Single Crystals, National Academy of Science of Ukraine, 60 Nauky Ave, 61072 Kharkiv, Ukraine
2V.N. Karazin Kharkiv National University, sqr. Svobody 4, Kharkiv, 61022, Ukraine
3Institute for Single Crystals, National Academy of Science of Ukraine, 60 Nauky Ave, 61072 Kharkiv, Ukraine
The paper presents the results of studying the formation of a through conductive inclusion in a layered sample for the case of sector conductive inclusions in single layers. The distribution of inclusions in the layers is uniform and independent in different layers. The values of the probability of occurrence of a through conductive inclusion are obtained for various values of the system parameters - the size of inclusions in layers, their number, and the number of layers. The dependences of this probability on the average filling of the layer with the conducting phase are obtained. Percolation threshold values are obtained.
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